Comparative Analysis of Deterministic and Random Modulations Based on Mathematical Models of Transmission Errors in Series Communication

Karol Niewiadomski, Robert Smolenski, Piotr Lezynski, Jacek Bojarski, David W. P. Thomas, Frede Blaabjerg

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
28 Downloads (Pure)


In many papers, random modulation of power electronic converters is described as an electromagnetic interference (EMI) mitigation technique, which contributes to the assurance of electromagnetic compatibility (EMC) of systems consisting of power electronic converters and serial transmission-based control and measuring devices. However, experimental results as well as theoretical analyses of physical phenomenon suggest that the EMI reduction is ostensible and results from the measuring procedure adopted in standards. This article presents the first known approach to compare the influence of deterministic and random modulation of transmission errors rate in serial communication systems. The comparison is based on the especially developed mathematical models, which are validated experimentally, using a simple setup with a dc/dc converter injecting a noise into the USB/RS232 converter representing a serial transmission scheme. The comparison reveals that for the studied switching frequency range from 10 kHz to 1 MHz, on average, there is no significant difference between random and deterministic modulations with respect to the probability of error rate in serial communication systems. Thus, in such systems, random modulation should not be considered as a valid EMC-assuring technique.
Original languageEnglish
Article number9779060
Pages (from-to)11985-11995
Number of pages11
JournalIEEE transactions on power electronics
Issue number10
Early online date19 May 2022
Publication statusPublished - 1 Oct 2022
Externally publishedYes


  • Electromagnetic interference
  • Switching frequency
  • Modulation
  • Electromagnetic compatibility
  • Time measurement
  • Mathematical models
  • Detectors


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