Comparing magnetic force microscopes images with different instruments using the CAMST reference samples

Leon Abelmann, S. Porthun, M.A.M. Haast, J.C. Lodder, A. Moser, M.E. Best, P.J.A. van Schendel, H.J. Hug, G.P. Heydon, A. Farley, S.R. Hoon, P. Rice, T. Pfaffelhuber

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the MFM-10 Workshop
    Place of PublicationSan Fransisco
    Number of pages2
    Publication statusPublished - 11 Jan 1998


    • METIS-113695

    Cite this