Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Leon Abelmann, Steffen Porthun, Marc Haast, Cock Lodder, Andreas Moser, Margaret E. Best, Pieter J.A. van Schendel, Bruno Stiefel, Hans J. Hug, Greg P. Heydon, Andrew Farley, Steve R. Hoon, Thomas Pfaffelhuber, Roger Proksch, Ken Babcock

    Research output: Contribution to journalArticleAcademicpeer-review

    44 Citations (Scopus)

    Abstract

    A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.
    Original languageEnglish
    Pages (from-to)135-147
    Number of pages13
    JournalJournal of magnetism and magnetic materials
    Volume190
    Issue number1-2
    DOIs
    Publication statusPublished - 1998

    Keywords

    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • SMI-TST: From 2006 in EWI-TST
    • TSTNE-Probe-MFM: Magnetic Force Microscope
    • Magnetic force microscopy
    • Resolution
    • Fourier analysis
    • Low temperature
    • Magneto-optic
    • Vacuum

    Fingerprint Dive into the research topics of 'Comparing the resolution of magnetic force microscopes using the CAMST reference samples'. Together they form a unique fingerprint.

    Cite this