Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Leon Abelmann; Steffen  Porthun; Marc Haast; Cock Lodder; Andreas Moser; Margaret E. Best; Pieter J.A. van Schendel; Bruno Stiefel; Hans J. Hug; Greg P. Heydon; Andrew Farley; Steve R. Hoon; Thomas Pfaffelhuber; Roger Proksch; Ken Babcock

doi:10.1016/S0304-8853(98)00281-9

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Leon Abelmann, Steffen Porthun, Marc Haast, Cock Lodder, Andreas Moser, Margaret E. Best, Pieter J.A. van Schendel, Bruno Stiefel, Hans J. Hug, Greg P. Heydon, Andrew Farley, Steve R. Hoon, Thomas Pfaffelhuber, Roger Proksch, Ken Babcock

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Abstract

A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

Original language	English
Pages (from-to)	135-147
Number of pages	13
Journal	Journal of magnetism and magnetic materials
Volume	190
Issue number	1-2
DOIs	https://doi.org/10.1016/S0304-8853(98)00281-9
Publication status	Published - 1998

Keywords

SMI-EXP: EXPERIMENTAL TECHNIQUES
SMI-TST: From 2006 in EWI-TST
TSTNE-Probe-MFM: Magnetic Force Microscope
Magnetic force microscopy
Resolution
Fourier analysis
Low temperature
Magneto-optic
Vacuum

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Abelmann, L., Porthun, S., Haast, M., Lodder, C., Moser, A., Best, M. E., van Schendel, P. J. A., Stiefel, B., Hug, H. J., Heydon, G. P., Farley, A., Hoon, S. R., Pfaffelhuber, T., Proksch, R., & Babcock, K. (1998). Comparing the resolution of magnetic force microscopes using the CAMST reference samples. Journal of magnetism and magnetic materials, 190(1-2), 135-147. https://doi.org/10.1016/S0304-8853(98)00281-9

@article{cee10106961e447fbab729079f5cb104,

title = "Comparing the resolution of magnetic force microscopes using the CAMST reference samples",

abstract = "A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very {\TH}ne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.",

keywords = "SMI-EXP: EXPERIMENTAL TECHNIQUES, SMI-TST: From 2006 in EWI-TST, TSTNE-Probe-MFM: Magnetic Force Microscope, Magnetic force microscopy, Resolution, Fourier analysis, Low temperature, Magneto-optic, Vacuum",

author = "Leon Abelmann and Steffen Porthun and Marc Haast and Cock Lodder and Andreas Moser and Best, {Margaret E.} and {van Schendel}, {Pieter J.A.} and Bruno Stiefel and Hug, {Hans J.} and Heydon, {Greg P.} and Andrew Farley and Hoon, {Steve R.} and Thomas Pfaffelhuber and Roger Proksch and Ken Babcock",

year = "1998",

doi = "10.1016/S0304-8853(98)00281-9",

language = "English",

volume = "190",

pages = "135--147",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1-2",

}

Abelmann, L, Porthun, S, Haast, M, Lodder, C, Moser, A, Best, ME, van Schendel, PJA, Stiefel, B, Hug, HJ, Heydon, GP, Farley, A, Hoon, SR, Pfaffelhuber, T, Proksch, R & Babcock, K 1998, 'Comparing the resolution of magnetic force microscopes using the CAMST reference samples', Journal of magnetism and magnetic materials, vol. 190, no. 1-2, pp. 135-147. https://doi.org/10.1016/S0304-8853(98)00281-9

TY - JOUR

T1 - Comparing the resolution of magnetic force microscopes using the CAMST reference samples

AU - Abelmann, Leon

AU - Porthun, Steffen

AU - Haast, Marc

AU - Lodder, Cock

AU - Moser, Andreas

AU - Best, Margaret E.

AU - van Schendel, Pieter J.A.

AU - Stiefel, Bruno

AU - Hug, Hans J.

AU - Heydon, Greg P.

AU - Farley, Andrew

AU - Hoon, Steve R.

AU - Pfaffelhuber, Thomas

AU - Proksch, Roger

AU - Babcock, Ken

PY - 1998

Y1 - 1998

N2 - A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

AB - A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

KW - SMI-TST: From 2006 in EWI-TST

KW - TSTNE-Probe-MFM: Magnetic Force Microscope

KW - Magnetic force microscopy

KW - Resolution

KW - Fourier analysis

KW - Low temperature

KW - Magneto-optic

KW - Vacuum

U2 - 10.1016/S0304-8853(98)00281-9

DO - 10.1016/S0304-8853(98)00281-9

M3 - Article

SN - 0304-8853

VL - 190

SP - 135

EP - 147

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

IS - 1-2

ER -

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

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Keywords

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