Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Leon Abelmann; Steffen  Porthun; Marc Haast; Cock Lodder; Andreas Moser; Margaret E. Best; Pieter J.A. van Schendel; Bruno Stiefel; Hans J. Hug; Greg P. Heydon; Andrew Farley; Steve R. Hoon; Thomas Pfaffelhuber; Roger Proksch; Ken Babcock

doi:10.1016/S0304-8853(98)00281-9

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Leon Abelmann
, Steffen Porthun
, Marc Haast
, Cock Lodder
, Andreas Moser
, Margaret E. Best
, Pieter J.A. van Schendel
, Bruno Stiefel
, Hans J. Hug
, Greg P. Heydon
, Andrew Farley
, Steve R. Hoon
, Thomas Pfaffelhuber
, Roger Proksch
, Ken Babcock

Research output: Contribution to journal › Article › Academic › peer-review

50 Citations (Scopus)

7 Downloads (Pure)

Abstract

A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

Original language	English
Pages (from-to)	135-147
Number of pages	13
Journal	Journal of magnetism and magnetic materials
Volume	190
Issue number	1-2
DOIs	https://doi.org/10.1016/S0304-8853(98)00281-9
Publication status	Published - 1998

Keywords

SMI-EXP: EXPERIMENTAL TECHNIQUES
SMI-TST: From 2006 in EWI-TST
TSTNE-Probe-MFM: Magnetic Force Microscope
Magnetic force microscopy
Resolution
Fourier analysis
Low temperature
Magneto-optic
Vacuum

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10.1016/S0304-8853(98)00281-9

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Abelmann, L., Porthun, S., Haast, M., Lodder, C., Moser, A., Best, M. E., van Schendel, P. J. A., Stiefel, B., Hug, H. J., Heydon, G. P., Farley, A., Hoon, S. R., Pfaffelhuber, T., Proksch, R., & Babcock, K. (1998). Comparing the resolution of magnetic force microscopes using the CAMST reference samples. Journal of magnetism and magnetic materials, 190(1-2), 135-147. https://doi.org/10.1016/S0304-8853(98)00281-9

@article{cee10106961e447fbab729079f5cb104,

title = "Comparing the resolution of magnetic force microscopes using the CAMST reference samples",

abstract = "A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very {\TH}ne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.",

keywords = "SMI-EXP: EXPERIMENTAL TECHNIQUES, SMI-TST: From 2006 in EWI-TST, TSTNE-Probe-MFM: Magnetic Force Microscope, Magnetic force microscopy, Resolution, Fourier analysis, Low temperature, Magneto-optic, Vacuum",

author = "Leon Abelmann and Steffen Porthun and Marc Haast and Cock Lodder and Andreas Moser and Best, \{Margaret E.\} and \{van Schendel\}, \{Pieter J.A.\} and Bruno Stiefel and Hug, \{Hans J.\} and Heydon, \{Greg P.\} and Andrew Farley and Hoon, \{Steve R.\} and Thomas Pfaffelhuber and Roger Proksch and Ken Babcock",

year = "1998",

doi = "10.1016/S0304-8853(98)00281-9",

language = "English",

volume = "190",

pages = "135--147",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1-2",

}

Abelmann, L, Porthun, S, Haast, M, Lodder, C, Moser, A, Best, ME, van Schendel, PJA, Stiefel, B, Hug, HJ, Heydon, GP, Farley, A, Hoon, SR, Pfaffelhuber, T, Proksch, R & Babcock, K 1998, 'Comparing the resolution of magnetic force microscopes using the CAMST reference samples', Journal of magnetism and magnetic materials, vol. 190, no. 1-2, pp. 135-147. https://doi.org/10.1016/S0304-8853(98)00281-9

TY - JOUR

T1 - Comparing the resolution of magnetic force microscopes using the CAMST reference samples

AU - Abelmann, Leon

AU - Porthun, Steffen

AU - Haast, Marc

AU - Lodder, Cock

AU - Moser, Andreas

AU - Best, Margaret E.

AU - van Schendel, Pieter J.A.

AU - Stiefel, Bruno

AU - Hug, Hans J.

AU - Heydon, Greg P.

AU - Farley, Andrew

AU - Hoon, Steve R.

AU - Pfaffelhuber, Thomas

AU - Proksch, Roger

AU - Babcock, Ken

PY - 1998

Y1 - 1998

N2 - A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

AB - A set of reference samples for comparing the results obtained with di¤erent magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these di¤erent microscopes, tips and measurement methods varies between 30 and 100 nm.

KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

KW - SMI-TST: From 2006 in EWI-TST

KW - TSTNE-Probe-MFM: Magnetic Force Microscope

KW - Magnetic force microscopy

KW - Resolution

KW - Fourier analysis

KW - Low temperature

KW - Magneto-optic

KW - Vacuum

U2 - 10.1016/S0304-8853(98)00281-9

DO - 10.1016/S0304-8853(98)00281-9

M3 - Article

SN - 0304-8853

VL - 190

SP - 135

EP - 147

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

IS - 1-2

ER -

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

Abstract

Keywords

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