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Comparison of electrical techniques for temperature evaluation in power MOS transistors
A. Ferrara, P.G. Steeneken, K. Reimann, A. Heringa, L. Yan, B.K. Boksteen, M. Swanenberg, G.E.J. Koops, A.J. Scholten, R. Surdeanu, Jurriaan Schmitz, Raymond Josephus Engelbart Hueting
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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