Comparison of recording properties of ME tape and thin MP tape with respect to overwrite behavior

S. Lalbahadoersing; J.P.J. Groenland; S.B. Luitjens; J.C. Lodder

doi:10.1109/20.617844

Comparison of recording properties of ME tape and thin MP tape with respect to overwrite behavior

S. Lalbahadoersing, J.P.J. Groenland, S.B. Luitjens, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.

Original language	Undefined
Pages (from-to)	3061-3063
Number of pages	3
Journal	IEEE transactions on magnetics
Volume	33
Issue number	33
DOIs	https://doi.org/10.1109/20.617844
Publication status	Published - 1997

Keywords

METIS-111881
IR-14948
EWI-5511
SMI-REC: RECORDING
SMI-TST: From 2006 in EWI-TST

Access to Document

10.1109/20.617844

Cite this

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title = "Comparison of recording properties of ME tape and thin MP tape with respect to overwrite behavior",

abstract = "Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.",

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AU - Lalbahadoersing, S.

AU - Groenland, J.P.J.

AU - Luitjens, S.B.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 1997

Y1 - 1997

N2 - Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.

AB - Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.

KW - METIS-111881

KW - IR-14948

KW - EWI-5511

KW - SMI-REC: RECORDING

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1109/20.617844

DO - 10.1109/20.617844

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