Component life-time modelling

J.F. Verweij, A.C. Brombacher

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 4th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
    Place of PublicationBordeaux
    Pages35-42
    Publication statusPublished - 4 Oct 1993

    Keywords

    • METIS-114004

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