Skip to main navigation Skip to search Skip to main content

Component lifetime modelling

  • J.F. Verweij
  • , A.C. Brombacher
  • , M.M. Lunenborg

    Research output: Contribution to journal › Article › Academic › peer-review

    449 Downloads (Pure)

    Abstract

    There are two approaches to component lifetime modelling. The first one uses a reliability prediction method as described in the (military) handbooks with the appropriate models and parameters. The advantages are: (a) It takes into account all possible failure mechanisms. (b) It is easy to use. The disadvantages are: (a) It assumes a constant failure rate which is often not the case (infant mortality). (b) It contains no designable parameters and therefore it cannot be used for built-in reliability. The second approach is to model the different degradation mechanisms and to incorporate this into an (existing) circuit simulator. Here we have also advantages and disadvantages which are mostly complementary to those of the first method.
    Original languageEnglish
    Pages (from-to)263-271
    JournalQuality and reliability engineering international
    Volume10
    Issue number4
    DOIs
    Publication statusPublished - 1994

    UN SDGs

    This output contributes to the following UN Sustainable Development Goals (SDGs)

    1. SDG 3 - Good Health and Well-being
      SDG 3 Good Health and Well-being

    Keywords

    • CNET
    • System reliability
    • Electromigration
    • ESD
    • Reliability
    • Simulation
    • MIL
    • MOS
    • Hot carriers
    • Lifetime modeling
    • Handbooks
    • Failure rate
    • IC
    • Component reliability
    • BT

    Fingerprint

    Dive into the research topics of 'Component lifetime modelling'. Together they form a unique fingerprint.

    Cite this