@inproceedings{35a42924d97c46b1942fccdbda4baf2a,
title = "Computer-Aided Test Flow in Core-Based Design",
abstract = "This paper copes with the test-pattern generation and fault coverage determination in the core based design. The basic core-test strategy that one has to apply in the core-based design is stated in this work. A Computer-Aided Test (CAT) flow is proposed resulting in accurate fault coverage of embedded cores. The CAT now is applied to a few cores within the Philips Core Test Pilot IC project",
keywords = "IR-16130, METIS-113015",
author = "V. Zivkovic and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",
year = "2000",
month = may,
day = "14",
doi = "10.1109/ICMEL.2000.838790",
language = "Undefined",
publisher = "IEEE",
pages = "715--718",
booktitle = "22nd International Conference on Microelectronics",
address = "United States",
note = "22nd International Conference on Microelectronics, 2000 ; Conference date: 14-05-2000 Through 17-05-2000",
}