Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis

Alexander Matthee; Niek Moonen; Frank Leferink

doi:10.1109/GEMCCON57842.2023.10078228

Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis

Alexander Matthee
, Niek Moonen
, Frank Leferink

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

83 Downloads (Pure)

Abstract

Power systems and loads are becoming more complex with the implementation of micro-grids and non-linear power electronics loads. Intermittent and rapidly changing load and supply behavior calls for measurement strategies which are adaptable and able to comprehensively analyze new technical challenges. In this paper, such a device is presented, with measurement bandwidth of mega-samples per second and multiple channel and location measurement capabilities optimized for micro-grid and low frequency (DC – 150 kHz). A micro-grid reliability test is conducted and presented where fast changing load conditions results in grid failure.

Original language	English
Title of host publication	2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	5-5
Number of pages	1
ISBN (Electronic)	979-8-3503-9693-5
ISBN (Print)	979-8-3503-9694-2
DOIs	https://doi.org/10.1109/GEMCCON57842.2023.10078228
Publication status	Published - 20 Jan 2023
Event	7th IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2023 - Merusaka Hotel, Nusa Dua, Indonesia Duration: 19 Jan 2023 → 20 Jan 2023 Conference number: 7 http://www.gemccon2023bali.org/

Conference

Conference	7th IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2023
Abbreviated title	GEMCCON 2023
Country/Territory	Indonesia
City	Nusa Dua
Period	19/01/23 → 20/01/23
Internet address	http://www.gemccon2023bali.org/

Keywords

Power measurement
Electromagnetic interference
Electromagnetic compatibility
Power electronics
Frequency measurement
Power system reliability
Behavioral sciences
2023 OA procedure

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10.1109/GEMCCON57842.2023.10078228

ArticleFinal published version, 312 KBLicence: Taverne

Cite this

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title = "Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis",

abstract = "Power systems and loads are becoming more complex with the implementation of micro-grids and non-linear power electronics loads. Intermittent and rapidly changing load and supply behavior calls for measurement strategies which are adaptable and able to comprehensively analyze new technical challenges. In this paper, such a device is presented, with measurement bandwidth of mega-samples per second and multiple channel and location measurement capabilities optimized for micro-grid and low frequency (DC – 150 kHz). A micro-grid reliability test is conducted and presented where fast changing load conditions results in grid failure.",

keywords = "Power measurement, Electromagnetic interference, Electromagnetic compatibility, Power electronics, Frequency measurement, Power system reliability, Behavioral sciences, 2023 OA procedure",

author = "Alexander Matthee and Niek Moonen and Frank Leferink",

note = "Funding Information: This research is funded by the ETOPIA project of the European Union{\textquoteright}s Horizon 2020 research and innovation programme under the Marie Sklodowska Curie grant agreement No 812753 Publisher Copyright: {\textcopyright} 2023 IEEE.; 7th IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2023, GEMCCON 2023 ; Conference date: 19-01-2023 Through 20-01-2023",

year = "2023",

month = jan,

day = "20",

doi = "10.1109/GEMCCON57842.2023.10078228",

language = "English",

isbn = "979-8-3503-9694-2",

pages = "5--5",

booktitle = "2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)",

publisher = "IEEE",

address = "United States",

url = "http://www.gemccon2023bali.org/",

}

Matthee, A, Moonen, N & Leferink, F 2023, Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis. in 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)., 10078228, IEEE, Piscataway, NJ, pp. 5-5, 7th IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2023, Nusa Dua, Indonesia, 19/01/23. https://doi.org/10.1109/GEMCCON57842.2023.10078228

TY - GEN

T1 - Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis

AU - Matthee, Alexander

AU - Moonen, Niek

AU - Leferink, Frank

N1 - Conference code: 7

PY - 2023/1/20

Y1 - 2023/1/20

N2 - Power systems and loads are becoming more complex with the implementation of micro-grids and non-linear power electronics loads. Intermittent and rapidly changing load and supply behavior calls for measurement strategies which are adaptable and able to comprehensively analyze new technical challenges. In this paper, such a device is presented, with measurement bandwidth of mega-samples per second and multiple channel and location measurement capabilities optimized for micro-grid and low frequency (DC – 150 kHz). A micro-grid reliability test is conducted and presented where fast changing load conditions results in grid failure.

AB - Power systems and loads are becoming more complex with the implementation of micro-grids and non-linear power electronics loads. Intermittent and rapidly changing load and supply behavior calls for measurement strategies which are adaptable and able to comprehensively analyze new technical challenges. In this paper, such a device is presented, with measurement bandwidth of mega-samples per second and multiple channel and location measurement capabilities optimized for micro-grid and low frequency (DC – 150 kHz). A micro-grid reliability test is conducted and presented where fast changing load conditions results in grid failure.

KW - Power measurement

KW - Electromagnetic interference

KW - Electromagnetic compatibility

KW - Power electronics

KW - Frequency measurement

KW - Power system reliability

KW - Behavioral sciences

KW - 2023 OA procedure

U2 - 10.1109/GEMCCON57842.2023.10078228

DO - 10.1109/GEMCCON57842.2023.10078228

M3 - Conference contribution

SN - 979-8-3503-9694-2

SP - 5

EP - 5

BT - 2023 IEEE 7th Global Electromagnetic Compatibility Conference (GEMCCON)

PB - IEEE

CY - Piscataway, NJ

T2 - 7th IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2023

Y2 - 19 January 2023 through 20 January 2023

ER -

Concentration of Multi-Point Measurement Data for DC-150 kHz EMI Analysis

Abstract

Conference

Keywords

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Cite this