Conductance anisotropy and linear magnetoresistance in La2SrxCuO4 thin films

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)205602-
JournalJournal of physics: Condensed matter
Volume23
Publication statusPublished - 2011

Keywords

  • METIS-280168

Cite this

@article{9788e96c847d46fe955ad42108db1316,
title = "Conductance anisotropy and linear magnetoresistance in La2SrxCuO4 thin films",
keywords = "METIS-280168",
author = "{van Zalk}, M. and Alexander Brinkman and Hilgenkamp, {Johannes W.M.}",
year = "2011",
language = "English",
volume = "23",
pages = "205602--",
journal = "Journal of physics: Condensed matter",
issn = "0953-8984",
publisher = "IOP Publishing Ltd.",

}

Conductance anisotropy and linear magnetoresistance in La2SrxCuO4 thin films. / van Zalk, M.; Brinkman, Alexander; Hilgenkamp, Johannes W.M.

In: Journal of physics: Condensed matter, Vol. 23, 2011, p. 205602-.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Conductance anisotropy and linear magnetoresistance in La2SrxCuO4 thin films

AU - van Zalk, M.

AU - Brinkman, Alexander

AU - Hilgenkamp, Johannes W.M.

PY - 2011

Y1 - 2011

KW - METIS-280168

M3 - Article

VL - 23

SP - 205602-

JO - Journal of physics: Condensed matter

JF - Journal of physics: Condensed matter

SN - 0953-8984

ER -