Confocal raman scanning electron microscopy a method for parallel non-invasive high resolution analysis of bone samples

A.A. van Apeldoorn; Y. Aksenov; M. Stigter; I. Hofland; J.D. de Bruijn; H.K. Koerten; J. Greve; C. Otto; C. van Blitterswijk

Confocal raman scanning electron microscopy a method for parallel non-invasive high resolution analysis of bone samples

A.A. van Apeldoorn, Y. Aksenov, M. Stigter, I. Hofland, J.D. de Bruijn, H.K. Koerten, J. Greve, C. Otto, C. van Blitterswijk

Research output: Contribution to conference › Poster › Other research output

Original language	English
Number of pages	1
Publication status	Published - 7 Nov 2003
Event	ZonMW/STW Symposium Tissue Engineering 2003 - Ede, Netherlands Duration: 7 Nov 2003 → 7 Nov 2003

Conference

Conference	ZonMW/STW Symposium Tissue Engineering 2003
Country/Territory	Netherlands
City	Ede
Period	7/11/03 → 7/11/03

Confocal Raman Scanning Electron Microscopy a Method for Parallel Non-Invasive High Resolution Analysis of Bone Samples
van Apeldoorn, A. A., Aksenov, Y., Stigter, M., Hofland, I., de Bruijn, J. D., Koerten, H. K., Greve, J., Otto, C. & van Blitterswijk, C., 30 Nov 2004, Jaarboek Nederlandse Vereniging voor Microscopie 2004. Koerten, H. K. (ed.). Sassenheim: Duineveld Drukkerij, p. 76-77 2 p. (Jaarboek Nederlandse Vereniging voor Microscopie; vol. 2004).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Cite this

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title = "Confocal raman scanning electron microscopy a method for parallel non-invasive high resolution analysis of bone samples",

author = "\{van Apeldoorn\}, A.A. and Y. Aksenov and M. Stigter and I. Hofland and \{de Bruijn\}, J.D. and H.K. Koerten and J. Greve and C. Otto and \{van Blitterswijk\}, C.",

year = "2003",

month = nov,

day = "7",

language = "English",

note = "ZonMW/STW Symposium Tissue Engineering 2003 ; Conference date: 07-11-2003 Through 07-11-2003",

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TY - CONF

T1 - Confocal raman scanning electron microscopy a method for parallel non-invasive high resolution analysis of bone samples

AU - van Apeldoorn, A.A.

AU - Aksenov, Y.

AU - Stigter, M.

AU - Hofland, I.

AU - de Bruijn, J.D.

AU - Koerten, H.K.

AU - Greve, J.

AU - Otto, C.

AU - van Blitterswijk, C.

PY - 2003/11/7

Y1 - 2003/11/7

M3 - Poster

T2 - ZonMW/STW Symposium Tissue Engineering 2003

Y2 - 7 November 2003 through 7 November 2003

ER -

Confocal raman scanning electron microscopy a method for parallel non-invasive high resolution analysis of bone samples

Conference

Research output

Confocal Raman Scanning Electron Microscopy a Method for Parallel Non-Invasive High Resolution Analysis of Bone Samples

Cite this