CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

K. Bal, A. Kirilyuk, Th. Rasing, Y. Luo, K. Samwer, M.A.M. Haast, J.C. Lodder

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    Abstract

    The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.
    Original languageUndefined
    Pages (from-to)4670-4672
    Number of pages3
    JournalJournal of Applied Physics
    Volume89
    Issue number8
    DOIs
    Publication statusPublished - 2001

    Keywords

    • EWI-5376
    • IR-62936
    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS

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