Abstract
The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.
Original language | Undefined |
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Pages (from-to) | 4670-4672 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 89 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2001 |
Keywords
- EWI-5376
- IR-62936
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS