CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

K. Bal; A. Kirilyuk; Th. Rasing; Y. Luo; K. Samwer; M.A.M. Haast; J.C. Lodder

doi:10.1063/1.1342799

CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

K. Bal, A. Kirilyuk, Th. Rasing, Y. Luo, K. Samwer, M.A.M. Haast, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

Abstract

The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.

Original language	Undefined
Pages (from-to)	4670-4672
Number of pages	3
Journal	Journal of Applied Physics
Volume	89
Issue number	8
DOIs	https://doi.org/10.1063/1.1342799
Publication status	Published - 2001

Keywords

EWI-5376
IR-62936
SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS

Access to Document

10.1063/1.1342799

http://eprints.eemcs.utwente.nl/secure2/5376/01/BAL2001.PDF

Cite this

@article{437af0b231ae4d548a0942459b963baa,

title = "CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy",

abstract = "The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.",

keywords = "EWI-5376, IR-62936, SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",

author = "K. Bal and A. Kirilyuk and Th. Rasing and Y. Luo and K. Samwer and M.A.M. Haast and J.C. Lodder",

note = "Imported from SMI Reference manager",

year = "2001",

doi = "10.1063/1.1342799",

language = "Undefined",

volume = "89",

pages = "4670--4672",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - CoNi/Pt interface roughness probed by nonlinear magneto-optics, x-ray scattering and atomic force microscopy

AU - Bal, K.

AU - Kirilyuk, A.

AU - Rasing, Th.

AU - Luo, Y.

AU - Samwer, K.

AU - Haast, M.A.M.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 2001

Y1 - 2001

N2 - The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.

AB - The crystallographic contribution of the nonlinear magneto-optical response from CoNi/Pt interfaces appears to scale linearly with increasing interface roughness as determined by small angle x-ray scattering and atomic force microscopy. From the magnetic contribution it follows that the increased interface roughness causes the interface moment to turn out of plane while the bulk of the film has an in-plane magnetization.

KW - EWI-5376

KW - IR-62936

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1063/1.1342799

DO - 10.1063/1.1342799

M3 - Article

VL - 89

SP - 4670

EP - 4672

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 8

ER -