Contributed Review: Review of integrated correlative light and electron microscopy

Frank Jan Timmermans, Cornelis Otto

Research output: Contribution to journalArticleAcademicpeer-review

24 Citations (Scopus)

Abstract

New developments in the field of microscopy enable to acquire increasing amounts of information from large sample areas and at an increased resolution. Depending on the nature of the technique, the information may reveal morphological, structural, chemical, and still other sample characteristics. In research fields, such as cell biology and materials science, there is an increasing demand to correlate these individual levels of information and in this way to obtain a better understanding of sample preparation and specific sample properties. To address this need, integrated systems were developed that combine nanometer resolution electron microscopes with optical microscopes, which produce chemically or label specific information through spectroscopy. The complementary information from electron microscopy and light microscopy presents an opportunity to investigate a broad range of sample properties in a correlated fashion. An important part of correlating the differences in information lies in bridging the different resolution and image contrast features. The trend to analyse samples using multiple correlated microscopes has resulted in a new research field. Current research is focused, for instance, on (a) the investigation of samples with nanometer scale distribution of inorganic and organic materials, (b) live cell analysis combined with electron microscopy, and (c) in situ spectroscopic and electron microscopy analysis of catalytic materials, but more areas will benefit from integrated correlative microscopy.
Original languageEnglish
Article number011501
Pages (from-to)-
Number of pages13
JournalReview of scientific instruments
Volume86
Issue number1
DOIs
Publication statusPublished - 2015

Keywords

  • IR-99826
  • METIS-313365

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