Control of oxygen sublattice structure in ultra-thin SrCuO2 films studied by X-ray photoelectron diffraction

Bouwe Kuiper; D. Samal; David H.A. Blank; Johan E. ten Elshof; Augustinus J.H.M. Rijnders; Gertjan Koster

doi:10.1063/1.4824779

Control of oxygen sublattice structure in ultra-thin SrCuO2 films studied by X-ray photoelectron diffraction

Bouwe Kuiper, D. Samal, David H.A. Blank, Johan E. ten Elshof, Augustinus J.H.M. Rijnders, Gertjan Koster

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Abstract

Epitaxial and atomically smooth ultra-thin SrCuO2 films are grown on SrTiO3 substrates using pulsed laser deposition. The structural and chemical aspects of these single-layer films of various thickness are characterized using in situ X-ray photoelectron diffraction (XPD) and photoelectron spectroscopy. By comparing XPD scans to multiple-scattering electron diffraction simulations, we demonstrate a structural transformation from bulk-planar to chain-type SrCuO2 as the film thickness is reduced from 9 to 3 unit-cells. This observation is in agreement with the recent theoretical prediction [Z. Zhong, G. Koster, and P. J. Kelly, Phys. Rev. B 85, 121411(R) (2012)] and opens new pathways for structural tuning in ultra-thin films of polar cuprates

Original language	English
Article number	042113
Number of pages	6
Journal	APL materials
Volume	1
Issue number	4
DOIs	https://doi.org/10.1063/1.4824779
Publication status	Published - 2013

Keywords

METIS-298380
IR-90015

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10.1063/1.4824779Licence: CC BY

Kuiper2013controlFinal published version, 910 KBLicence: CC BY

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title = "Control of oxygen sublattice structure in ultra-thin SrCuO2 films studied by X-ray photoelectron diffraction",

abstract = "Epitaxial and atomically smooth ultra-thin SrCuO2 films are grown on SrTiO3 substrates using pulsed laser deposition. The structural and chemical aspects of these single-layer films of various thickness are characterized using in situ X-ray photoelectron diffraction (XPD) and photoelectron spectroscopy. By comparing XPD scans to multiple-scattering electron diffraction simulations, we demonstrate a structural transformation from bulk-planar to chain-type SrCuO2 as the film thickness is reduced from 9 to 3 unit-cells. This observation is in agreement with the recent theoretical prediction [Z. Zhong, G. Koster, and P. J. Kelly, Phys. Rev. B 85, 121411(R) (2012)] and opens new pathways for structural tuning in ultra-thin films of polar cuprates",

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T1 - Control of oxygen sublattice structure in ultra-thin SrCuO2 films studied by X-ray photoelectron diffraction

AU - Kuiper, Bouwe

AU - Samal, D.

AU - Blank, David H.A.

AU - ten Elshof, Johan E.

AU - Rijnders, Augustinus J.H.M.

AU - Koster, Gertjan

N1 - Open access

PY - 2013

Y1 - 2013

N2 - Epitaxial and atomically smooth ultra-thin SrCuO2 films are grown on SrTiO3 substrates using pulsed laser deposition. The structural and chemical aspects of these single-layer films of various thickness are characterized using in situ X-ray photoelectron diffraction (XPD) and photoelectron spectroscopy. By comparing XPD scans to multiple-scattering electron diffraction simulations, we demonstrate a structural transformation from bulk-planar to chain-type SrCuO2 as the film thickness is reduced from 9 to 3 unit-cells. This observation is in agreement with the recent theoretical prediction [Z. Zhong, G. Koster, and P. J. Kelly, Phys. Rev. B 85, 121411(R) (2012)] and opens new pathways for structural tuning in ultra-thin films of polar cuprates

AB - Epitaxial and atomically smooth ultra-thin SrCuO2 films are grown on SrTiO3 substrates using pulsed laser deposition. The structural and chemical aspects of these single-layer films of various thickness are characterized using in situ X-ray photoelectron diffraction (XPD) and photoelectron spectroscopy. By comparing XPD scans to multiple-scattering electron diffraction simulations, we demonstrate a structural transformation from bulk-planar to chain-type SrCuO2 as the film thickness is reduced from 9 to 3 unit-cells. This observation is in agreement with the recent theoretical prediction [Z. Zhong, G. Koster, and P. J. Kelly, Phys. Rev. B 85, 121411(R) (2012)] and opens new pathways for structural tuning in ultra-thin films of polar cuprates

KW - METIS-298380

KW - IR-90015

U2 - 10.1063/1.4824779

DO - 10.1063/1.4824779

M3 - Article

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JO - APL materials

JF - APL materials

IS - 4

M1 - 042113

ER -

Control of oxygen sublattice structure in ultra-thin SrCuO2 films studied by X-ray photoelectron diffraction

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