Controlled point and line defects in 3D silicon inverse woodpile photonic band gap crystals

Diana Grishina, J. Perez-Vizcaino, Oluwafemi Stephen Ojambati, Aart Lagendijk, Willem L. Vos

Research output: Contribution to conferencePoster

Original languageEnglish
Pages-
Publication statusPublished - 13 Feb 2016
EventSPIE Photonics West 2016 - The Moscone Center, San Fransisco, United States
Duration: 13 Feb 201618 Feb 2016

Conference

ConferenceSPIE Photonics West 2016
CountryUnited States
CitySan Fransisco
Period13/02/1618/02/16

Keywords

  • METIS-317757

Cite this

Grishina, D., Perez-Vizcaino, J., Ojambati, O. S., Lagendijk, A., & Vos, W. L. (2016). Controlled point and line defects in 3D silicon inverse woodpile photonic band gap crystals. -. Poster session presented at SPIE Photonics West 2016, San Fransisco, United States.