Controlled sub-10-nanometer poly(N-isopropyl-acrylamide) layers grafted from silicon by atom transfer radical polymerization

Andreas S. Schulz, Hubert Gojzewski, Jurriaan Huskens, Willem L. Vos, G. Julius Vancso (Corresponding Author)

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)
6 Downloads (Pure)

Abstract

Surface-initiated atom transfer radical polymerization (SI-ATRP) was used to graft poly(N-isopropylacrylamide) (PNIPAM) brush layers with a controllable thickness in the 10-nm range from silicon substrates. The rate of polymerization of N-isopropylacrylamide was tuned by the [Cu(II)]0/[Cu(I)]0 ratio between the deactivating and activating species. The polymer layer thickness was characterized by atomic force microscopy (AFM) and ellipsometry. PNIPAM layers with a dry thickness between 5.5 and 16 nm were obtained. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) confirmed that the chemical structure is PNIPAM brushes. Analysis of the AFM data showed that our procedure leads to polymer grafts in the "mushroom-to-brush" transition regime.

Original languageEnglish
Pages (from-to)806-813
Number of pages8
JournalPolymers for advanced technologies
Volume29
Issue number2
DOIs
Publication statusPublished - Feb 2018

Fingerprint

Atom transfer radical polymerization
Silicon
Brushes
Grafts
Atomic force microscopy
Graft copolymers
Ellipsometry
Secondary ion mass spectrometry
Polymers
Polymerization
Substrates
poly-N-isopropylacrylamide

Keywords

  • UT-Hybrid-D
  • Poly(N-isopropylacrylamide)
  • Polymer brushes
  • Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
  • Atom transfer radical polymerization

Cite this

@article{42e74eaaea8f493b98138f1a34fb600c,
title = "Controlled sub-10-nanometer poly(N-isopropyl-acrylamide) layers grafted from silicon by atom transfer radical polymerization",
abstract = "Surface-initiated atom transfer radical polymerization (SI-ATRP) was used to graft poly(N-isopropylacrylamide) (PNIPAM) brush layers with a controllable thickness in the 10-nm range from silicon substrates. The rate of polymerization of N-isopropylacrylamide was tuned by the [Cu(II)]0/[Cu(I)]0 ratio between the deactivating and activating species. The polymer layer thickness was characterized by atomic force microscopy (AFM) and ellipsometry. PNIPAM layers with a dry thickness between 5.5 and 16 nm were obtained. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) confirmed that the chemical structure is PNIPAM brushes. Analysis of the AFM data showed that our procedure leads to polymer grafts in the {"}mushroom-to-brush{"} transition regime.",
keywords = "UT-Hybrid-D, Poly(N-isopropylacrylamide), Polymer brushes, Time-of-flight secondary ion mass spectrometry (ToF-SIMS), Atom transfer radical polymerization",
author = "Schulz, {Andreas S.} and Hubert Gojzewski and Jurriaan Huskens and Vos, {Willem L.} and {Julius Vancso}, G.",
note = "Wiley deal",
year = "2018",
month = "2",
doi = "10.1002/pat.4187",
language = "English",
volume = "29",
pages = "806--813",
journal = "Polymers for advanced technologies",
issn = "1042-7147",
publisher = "Wiley",
number = "2",

}

TY - JOUR

T1 - Controlled sub-10-nanometer poly(N-isopropyl-acrylamide) layers grafted from silicon by atom transfer radical polymerization

AU - Schulz, Andreas S.

AU - Gojzewski, Hubert

AU - Huskens, Jurriaan

AU - Vos, Willem L.

AU - Julius Vancso, G.

N1 - Wiley deal

PY - 2018/2

Y1 - 2018/2

N2 - Surface-initiated atom transfer radical polymerization (SI-ATRP) was used to graft poly(N-isopropylacrylamide) (PNIPAM) brush layers with a controllable thickness in the 10-nm range from silicon substrates. The rate of polymerization of N-isopropylacrylamide was tuned by the [Cu(II)]0/[Cu(I)]0 ratio between the deactivating and activating species. The polymer layer thickness was characterized by atomic force microscopy (AFM) and ellipsometry. PNIPAM layers with a dry thickness between 5.5 and 16 nm were obtained. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) confirmed that the chemical structure is PNIPAM brushes. Analysis of the AFM data showed that our procedure leads to polymer grafts in the "mushroom-to-brush" transition regime.

AB - Surface-initiated atom transfer radical polymerization (SI-ATRP) was used to graft poly(N-isopropylacrylamide) (PNIPAM) brush layers with a controllable thickness in the 10-nm range from silicon substrates. The rate of polymerization of N-isopropylacrylamide was tuned by the [Cu(II)]0/[Cu(I)]0 ratio between the deactivating and activating species. The polymer layer thickness was characterized by atomic force microscopy (AFM) and ellipsometry. PNIPAM layers with a dry thickness between 5.5 and 16 nm were obtained. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) confirmed that the chemical structure is PNIPAM brushes. Analysis of the AFM data showed that our procedure leads to polymer grafts in the "mushroom-to-brush" transition regime.

KW - UT-Hybrid-D

KW - Poly(N-isopropylacrylamide)

KW - Polymer brushes

KW - Time-of-flight secondary ion mass spectrometry (ToF-SIMS)

KW - Atom transfer radical polymerization

UR - http://www.scopus.com/inward/record.url?scp=85031117522&partnerID=8YFLogxK

U2 - 10.1002/pat.4187

DO - 10.1002/pat.4187

M3 - Article

VL - 29

SP - 806

EP - 813

JO - Polymers for advanced technologies

JF - Polymers for advanced technologies

SN - 1042-7147

IS - 2

ER -