Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy

Georgios Ctistis, E.H. Frater, E.H. Frater, S.R. Huisman, Jeroen P. Korterik, Jennifer Lynn Herek, Willem L. Vos, Pepijn Willemszoon Harry Pinkse

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Abstract

We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning-probe microscopy
Original languageEnglish
Pages (from-to)375502-1-375502-5
Number of pages5
JournalJournal of physics D: applied physics
Volume44
DOIs
Publication statusPublished - 2011

Fingerprint

Scanning probe microscopy
forks
Q factors
Tuning
tuning
microscopy
scanning
probes
Quartz
dynamic response
Temperature
Dynamic response
temperature
quartz

Keywords

  • METIS-281058
  • IR-78075

Cite this

@article{26760c305b0747d0bc20ae4f88095741,
title = "Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy",
abstract = "We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning-probe microscopy",
keywords = "METIS-281058, IR-78075",
author = "Georgios Ctistis and E.H. Frater and E.H. Frater and S.R. Huisman and Korterik, {Jeroen P.} and Herek, {Jennifer Lynn} and Vos, {Willem L.} and Pinkse, {Pepijn Willemszoon Harry}",
year = "2011",
doi = "10.1088/0022-3727/44/37/375502",
language = "English",
volume = "44",
pages = "375502--1--375502--5",
journal = "Journal of physics D: applied physics",
issn = "0022-3727",
publisher = "IOP Publishing Ltd.",

}

Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy. / Ctistis, Georgios; Frater, E.H.; Frater, E.H.; Huisman, S.R.; Korterik, Jeroen P.; Herek, Jennifer Lynn; Vos, Willem L.; Pinkse, Pepijn Willemszoon Harry.

In: Journal of physics D: applied physics, Vol. 44, 2011, p. 375502-1-375502-5.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Controlling the quality factor of a tuning-fork resonance between 9 and 300 K for scanning-probe microscopy

AU - Ctistis, Georgios

AU - Frater, E.H.

AU - Frater, E.H.

AU - Huisman, S.R.

AU - Korterik, Jeroen P.

AU - Herek, Jennifer Lynn

AU - Vos, Willem L.

AU - Pinkse, Pepijn Willemszoon Harry

PY - 2011

Y1 - 2011

N2 - We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning-probe microscopy

AB - We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning-probe microscopy

KW - METIS-281058

KW - IR-78075

U2 - 10.1088/0022-3727/44/37/375502

DO - 10.1088/0022-3727/44/37/375502

M3 - Article

VL - 44

SP - 375502-1-375502-5

JO - Journal of physics D: applied physics

JF - Journal of physics D: applied physics

SN - 0022-3727

ER -