Correlative transmission electron microscopy and electrical properties study of switchable phase-change random access memory line cells

J.L.M. Oosthoek, F. C. Voogt, K. Attenborough, M.A. Verheijen, G.A.M. Hurkx, D. J. Gravesteijn, B. J. Kooi*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Physics & Astronomy