CO2 sorption of a ceramic separation membrane

Herbert Wormeester*, Nieck E. Benes, Gerald I. Spijksma, Henk Verweij, Bene Poelsema

*Corresponding author for this work

Research output: Contribution to journalConference articleAcademicpeer-review

6 Citations (Scopus)
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The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.
Original languageEnglish
Pages (from-to)747-751
Number of pages5
JournalThin solid films
Publication statusPublished - 2004
Event3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003 - Vienna, Austria
Duration: 6 Jul 200311 Jul 2003
Conference number: 3


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