The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.
|Number of pages||5|
|Journal||Thin solid films|
|Publication status||Published - 2004|
|Event||3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003 - Vienna, Austria|
Duration: 6 Jul 2003 → 11 Jul 2003
Conference number: 3
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