CO2 sorption of a ceramic separation membrane

Herbert Wormeester; Nieck E. Benes; Gerald I. Spijksma; Henk Verweij; Bene Poelsema

doi:10.1016/j.tsf.2004.01.041

CO₂ sorption of a ceramic separation membrane

Herbert Wormeester^*
, Nieck E. Benes
, Gerald I. Spijksma
, Henk Verweij
, Bene Poelsema

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › Academic › peer-review

6 Citations (Scopus)

114 Downloads (Pure)

Abstract

The ellipsometric characterization of the CO₂ sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

Original language	English
Pages (from-to)	747-751
Number of pages	5
Journal	Thin solid films
Volume	455-456
DOIs	https://doi.org/10.1016/j.tsf.2004.01.041
Publication status	Published - 2004
Event	3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003 - Vienna, Austria Duration: 6 Jul 2003 → 11 Jul 2003 Conference number: 3

Keywords

2023 OA procedure

Access to Document

10.1016/j.tsf.2004.01.041

ArticleFinal published version, 128 KBLicence: Taverne

Cite this

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title = "CO2 sorption of a ceramic separation membrane",

abstract = "The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.",

keywords = "2023 OA procedure",

author = "Herbert Wormeester and Benes, \{Nieck E.\} and Spijksma, \{Gerald I.\} and Henk Verweij and Bene Poelsema",

year = "2004",

doi = "10.1016/j.tsf.2004.01.041",

language = "English",

volume = "455-456",

pages = "747--751",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier",

note = "3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003, ICSE ; Conference date: 06-07-2003 Through 11-07-2003",

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TY - JOUR

T1 - CO2 sorption of a ceramic separation membrane

AU - Wormeester, Herbert

AU - Benes, Nieck E.

AU - Spijksma, Gerald I.

AU - Verweij, Henk

AU - Poelsema, Bene

N1 - Conference code: 3

PY - 2004

Y1 - 2004

N2 - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

AB - The ellipsometric characterization of the CO2 sorption of a silica membrane provides a fast and accurate technique for the characterization of maximum sorption and the heat of adsorption. Both parameters are evaluated for the 73 nm thick silica layer as well as the 1650 nm thick supporting γ-layer. The applicability of ellipsometry for studying sorption of supported membranes relies on a careful analysis of the membrane prior to sorption measurements.

KW - 2023 OA procedure

U2 - 10.1016/j.tsf.2004.01.041

DO - 10.1016/j.tsf.2004.01.041

M3 - Conference article

SN - 0040-6090

VL - 455-456

SP - 747

EP - 751

JO - Thin solid films

JF - Thin solid films

T2 - 3rd International Conference on Spectroscopic Ellipsometry, ICSE 2003

Y2 - 6 July 2003 through 11 July 2003

ER -