CO2 Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry

CO₂ Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry

Research output: Contribution to conference › Poster › Other research output

Original language	English
Number of pages	1
Publication status	Published - 27 May 2002
Event	FOM Materials Research 2002 - Veldhoven, Netherlands Duration: 27 May 2002 → 28 May 2002

@conference{bc3848fed20c4b438062dee42c77495f,

title = "CO2 Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry",

author = "Benes, {Nieck E.} and Gerald Spijksma and Henk Verweij and Herbert Wormeester and Bene Poelsema",

year = "2002",

month = may,

day = "27",

language = "English",

note = "FOM Materials Research 2002 ; Conference date: 27-05-2002 Through 28-05-2002",

}