CO₂ Sorption of a Thin Silica Layer Determined with Spectroscopic Ellipsometry

Nieck E. Benes, Gerald Spijksma, Henk Verweij, Herbert Wormeester, Bene Poelsema

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2001
CO₂ sorption of a thin silica layer determined by spectroscopic ellipsometry
Benes, N. E., Spijksma, G., Verweij, H., Wormeester, H. & Poelsema, B., 2001, In: AIChE journal. 47, 5, p. 1212-1218 7 p.
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