Critical Analysis of Non-Nuclear Electron-Density Maxima and the Maximum Entropy Method

R.Y. de Vries, Willem J. Briels, D. Feil, D. Feil

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Abstract

Experimental evidence for the existence of non-nuclear maxima in charge densities is questioned. It is shown that the non-nuclear maxima reported for silicon are artifacts of the maximum entropy method that was used to analyze the x-ray diffraction data. This method can be improved by the use of appropriate prior information. We report systematic tests of the improved method leading to the absence of non-nuclear maxima in Si. Likewise, the non-nuclear maxima reported earlier in beryllium are not substantiated.
Original languageUndefined
Pages (from-to)1719-1722
Number of pages4
JournalPhysical review letters
Volume1996
Issue number77
DOIs
Publication statusPublished - 1996

Keywords

  • METIS-129514
  • IR-59115

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