Critical current degradation in HTS wires due to cyclic mechanical strain

David T. Ryan; Liang Li; Xianrui Huang; J.W. Bray; Evangelos T. Laskaris; Kiruba Sivasubramaniam; Aniruddha D. Gadre; James M. Fogerty; E.J. Harley; A. Otto; A. den Ouden

doi:10.1109/TASC.2005.849392

Critical current degradation in HTS wires due to cyclic mechanical strain

David T. Ryan, Liang Li, Xianrui Huang, J.W. Bray, Evangelos T. Laskaris, Kiruba Sivasubramaniam, Aniruddha D. Gadre, James M. Fogerty, E.J. Harley, A. Otto, A. den Ouden

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.

Original language	Undefined
Pages (from-to)	3684-3687
Number of pages	4
Journal	IEEE transactions on applied superconductivity
Volume	15
Issue number	2/2
DOIs	https://doi.org/10.1109/TASC.2005.849392
Publication status	Published - 3 Oct 2005

Keywords

IR-54007
METIS-227464

Access to Document

10.1109/TASC.2005.849392

Critical_current_-_ryan

Cite this

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title = "Critical current degradation in HTS wires due to cyclic mechanical strain",

abstract = "HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.",

keywords = "IR-54007, METIS-227464",

author = "Ryan, {David T.} and Liang Li and Xianrui Huang and J.W. Bray and Laskaris, {Evangelos T.} and Kiruba Sivasubramaniam and Gadre, {Aniruddha D.} and Fogerty, {James M.} and E.J. Harley and A. Otto and {den Ouden}, A.",

year = "2005",

month = oct,

day = "3",

doi = "10.1109/TASC.2005.849392",

language = "Undefined",

volume = "15",

pages = "3684--3687",

journal = "IEEE transactions on applied superconductivity",

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TY - JOUR

T1 - Critical current degradation in HTS wires due to cyclic mechanical strain

AU - Ryan, David T.

AU - Li, Liang

AU - Huang, Xianrui

AU - Bray, J.W.

AU - Laskaris, Evangelos T.

AU - Sivasubramaniam, Kiruba

AU - Gadre, Aniruddha D.

AU - Fogerty, James M.

AU - Harley, E.J.

AU - Otto, A.

AU - den Ouden, A.

PY - 2005/10/3

Y1 - 2005/10/3

N2 - HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.

AB - HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.

KW - IR-54007

KW - METIS-227464

U2 - 10.1109/TASC.2005.849392

DO - 10.1109/TASC.2005.849392

M3 - Article

SN - 1051-8223

VL - 15

SP - 3684

EP - 3687

JO - IEEE transactions on applied superconductivity

JF - IEEE transactions on applied superconductivity

IS - 2/2

ER -