Critical current degradation in HTS wires due to cyclic mechanical strain

David T. Ryan, Liang Li, Xianrui Huang, J.W. Bray, Evangelos T. Laskaris, Kiruba Sivasubramaniam, Aniruddha D. Gadre, James M. Fogerty, E.J. Harley, A. Otto, A. den Ouden

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    Abstract

    HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.
    Original languageUndefined
    Pages (from-to)3684-3687
    Number of pages4
    JournalIEEE transactions on applied superconductivity
    Volume15
    Issue number2/2
    DOIs
    Publication statusPublished - 3 Oct 2005

    Keywords

    • IR-54007
    • METIS-227464

    Cite this

    Ryan, D. T., Li, L., Huang, X., Bray, J. W., Laskaris, E. T., Sivasubramaniam, K., ... den Ouden, A. (2005). Critical current degradation in HTS wires due to cyclic mechanical strain. IEEE transactions on applied superconductivity, 15(2/2), 3684-3687. https://doi.org/10.1109/TASC.2005.849392