Critical current degradation in HTS wires due to cyclic mechanical strain

David T. Ryan, Liang Li, Xianrui Huang, J.W. Bray, Evangelos T. Laskaris, Kiruba Sivasubramaniam, Aniruddha D. Gadre, James M. Fogerty, E.J. Harley, A. Otto, A. den Ouden

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