Critical Review of 1-Particle Models in Electromigration Resistance Change Modeling

J. Niehof, H.C. de Graaff, A.J. Mouthaan, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    Original languageUndefined
    Title of host publicationSymposium Materials Research Society, Materials Reliability in Microelectronics IV
    Place of PublicationSan Fransisco, California, U.S.A.
    Pages465-470
    Publication statusPublished - 5 Apr 1994

    Keywords

    • METIS-113979

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