Cross-sectional TEM analysis of thin iron films deposited on quartz substrate and sintered at 700 K in nirogen atmosphere

Enrico G. Keim, W.F. Lisowski

    Research output: Contribution to conferencePoster

    Original languageUndefined
    Pages-
    Publication statusPublished - 5 Aug 2001
    EventMicroscopy & Microanalysis 2001 - Long Beach, United States
    Duration: 5 Aug 20019 Aug 2001

    Conference

    ConferenceMicroscopy & Microanalysis 2001
    CountryUnited States
    CityLong Beach
    Period5/08/019/08/01

    Keywords

    • METIS-202137

    Cite this

    Keim, E. G., & Lisowski, W. F. (2001). Cross-sectional TEM analysis of thin iron films deposited on quartz substrate and sintered at 700 K in nirogen atmosphere. -. Poster session presented at Microscopy & Microanalysis 2001, Long Beach, United States.