Crosstalk statistics via collocation method

F. Diouf, Flavio Canavero

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    19 Citations (Scopus)
    2 Downloads (Pure)

    Abstract

    A probabilistic model for the evaluation of transmission lines crosstalk is proposed. The geometrical parameters are assumed to be unknown and the exact solution is decomposed into two functions, one depending solely on the random parameters and the other on the frequency. The stochastic collocation method is used to estimate the crosstalk statistical moments. The results are obtained from a limited number of carefully-chosen values of the random geometrical parameters. The estimated statistical moments are then used to build the probability density function of the crosstalk parameters. A Monte Carlo validation demonstrates the accuracy and efficiency of the advocated method.
    Original languageEnglish
    Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
    Place of PublicationLos Alamitos
    PublisherIEEE Computer Society
    Pages92-97
    Number of pages6
    ISBN (Print)978-1-4244-4267-6
    DOIs
    Publication statusPublished - 19 Aug 2009
    Event2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin Convention Center, Austin, United States
    Duration: 17 Aug 200921 Aug 2009

    Conference

    Conference2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
    Abbreviated titleEMC
    CountryUnited States
    CityAustin
    Period17/08/0921/08/09

    Keywords

    • METIS-265762
    • IR-68475
    • EWI-16510
    • EC Grant Agreement nr.: FP7/2007-2013
    • EC Grant Agreement nr.: FP7/205294

    Fingerprint Dive into the research topics of 'Crosstalk statistics via collocation method'. Together they form a unique fingerprint.

  • Cite this

    Diouf, F., & Canavero, F. (2009). Crosstalk statistics via collocation method. In IEEE International Symposium on Electromagnetic Compatibility (pp. 92-97). Los Alamitos: IEEE Computer Society. https://doi.org/10.1109/ISEMC.2009.5284686