Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.
|Publication status||Published - 22 May 2017|
|Event||Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017 - Strasbourg Convention Centre, Strasbourg, France|
Duration: 22 May 2017 → 26 May 2017
|Conference||Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017|
|Period||22/05/17 → 26/05/17|