Crystal surface characterization

Konstantin Nikolaev, Igor Makhotkin (Contributor), Sergey Yakunin, Robbert van de Kruijs (Contributor), Fred Bijkerk (Contributor)

Research output: Contribution to conferencePosterOther research output

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Abstract

Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.
Original languageEnglish
Publication statusPublished - 22 May 2017
EventSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017 - Strasbourg Convention Centre, Strasbourg, France
Duration: 22 May 201726 May 2017
https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs

Conference

ConferenceSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Abbreviated titleALTECH
CountryFrance
CityStrasbourg
Period22/05/1726/05/17
Internet address

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crystal surfaces
grazing incidence
x rays
insulators
injection
modulation
geometry
electronics
diffraction

Keywords

    Cite this

    Nikolaev, K., Makhotkin, I., Yakunin, S., van de Kruijs, R., & Bijkerk, F. (2017). Crystal surface characterization. Poster session presented at Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France.
    Nikolaev, Konstantin ; Makhotkin, Igor ; Yakunin, Sergey ; van de Kruijs, Robbert ; Bijkerk, Fred. / Crystal surface characterization. Poster session presented at Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France.
    @conference{d485d80752b240048fc3afa1ee2d6cb2,
    title = "Crystal surface characterization",
    abstract = "Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.",
    author = "Konstantin Nikolaev and Igor Makhotkin and Sergey Yakunin and {van de Kruijs}, Robbert and Fred Bijkerk",
    year = "2017",
    month = "5",
    day = "22",
    language = "English",
    note = "Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, ALTECH ; Conference date: 22-05-2017 Through 26-05-2017",
    url = "https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs",

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    Nikolaev, K, Makhotkin, I, Yakunin, S, van de Kruijs, R & Bijkerk, F 2017, 'Crystal surface characterization' Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France, 22/05/17 - 26/05/17, .

    Crystal surface characterization. / Nikolaev, Konstantin ; Makhotkin, Igor (Contributor); Yakunin, Sergey; van de Kruijs, Robbert (Contributor); Bijkerk, Fred (Contributor).

    2017. Poster session presented at Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France.

    Research output: Contribution to conferencePosterOther research output

    TY - CONF

    T1 - Crystal surface characterization

    AU - Nikolaev, Konstantin

    AU - Yakunin, Sergey

    A2 - Makhotkin, Igor

    A2 - van de Kruijs, Robbert

    A2 - Bijkerk, Fred

    PY - 2017/5/22

    Y1 - 2017/5/22

    N2 - Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.

    AB - Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.

    M3 - Poster

    ER -

    Nikolaev K, Makhotkin I, Yakunin S, van de Kruijs R, Bijkerk F. Crystal surface characterization. 2017. Poster session presented at Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France.