Crystal surface characterization

Konstantin Nikolaev, Igor Makhotkin (Contributor), Sergey Yakunin, Robbert van de Kruijs (Contributor), Fred Bijkerk (Contributor)

Research output: Contribution to conferencePoster

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Abstract

Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.
Original languageEnglish
Publication statusPublished - 22 May 2017
EventSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017 - Strasbourg Convention Centre, Strasbourg, France
Duration: 22 May 201726 May 2017
https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs

Conference

ConferenceSymposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Abbreviated titleALTECH
CountryFrance
CityStrasbourg
Period22/05/1726/05/17
Internet address

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    Nikolaev, K., Makhotkin, I., Yakunin, S., van de Kruijs, R., & Bijkerk, F. (2017). Crystal surface characterization. Poster session presented at Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, Strasbourg, France.