Crystal surface characterization

Konstantin  Nikolaev; Igor Makhotkin; Sergey Yakunin; Robbert van de Kruijs; Fred Bijkerk

Crystal surface characterization

Konstantin Nikolaev, Igor Makhotkin (Contributor), Sergey Yakunin, Robbert van de Kruijs (Contributor), Fred Bijkerk (Contributor)

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Abstract

Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.

Original language	English
Publication status	Published - 22 May 2017
Event	Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017 - Strasbourg Convention Centre, Strasbourg, France Duration: 22 May 2017 → 26 May 2017 https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs

Conference

Conference	Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017
Abbreviated title	ALTECH
Country/Territory	France
City	Strasbourg
Period	22/05/17 → 26/05/17
Internet address	https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs

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title = "Crystal surface characterization",

abstract = "Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.",

author = "Konstantin Nikolaev and Igor Makhotkin and Sergey Yakunin and {van de Kruijs}, Robbert and Fred Bijkerk",

year = "2017",

month = may,

day = "22",

language = "English",

note = "Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017, ALTECH ; Conference date: 22-05-2017 Through 26-05-2017",

url = "https://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs",

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TY - CONF

T1 - Crystal surface characterization

AU - Nikolaev, Konstantin

AU - Yakunin, Sergey

A2 - Makhotkin, Igor

A2 - van de Kruijs, Robbert

A2 - Bijkerk, Fred

PY - 2017/5/22

Y1 - 2017/5/22

N2 - Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.

AB - Characterization of the structure of the crystal surface is essential for next generation electronics devices. Such as spin injection structures and topological insulators, to name a few. We have studied the advantages of characterization of the crystal surface based on the analysis of modulations of specular X-ray reflection occurred during the azimuthal scan in grazing incidence X-ray diffraction (GID) geometry.

M3 - Poster

T2 - Symposium on Analytical techniques for precise characterization of nano materials, ALTECH 2017

Y2 - 22 May 2017 through 26 May 2017

ER -

Crystal surface characterization

Abstract

Conference

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