Damage mechanisms in Mo/Si multilayer optics for short-wavelengths FELs

R.A. Loch, R. Sobierajski, C. Bostedt, J. Bozek, S. Bruijn, T. Burian, J.C. Castagna, J. Chalupsky, Y. Feng, J. Gaudin, A. Graf, V. Hajkova, E.D. van Hattum, S. Hau-Riege, Robbert Wilhelmus Elisabeth van de Kruijs, D. Klinger, J. Krzywinski, U. Jastrow, L. Juha, Eric LouisM. Messerschmidt, S. Moeller, K. Tiedtke, Frederik Bijkerk

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Pages-
Publication statusPublished - 28 Jun 2010
EventEuroFEL Workshop on Photon Beamlines & Diagnostics - Hamburg, Duitsland
Duration: 28 Jun 201030 Jun 2010

Conference

ConferenceEuroFEL Workshop on Photon Beamlines & Diagnostics
CityHamburg, Duitsland
Period28/06/1030/06/10

Keywords

  • METIS-270310

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