Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses

Igor A. Makhotkin, Igor Milov (Contributor), Ryszard Sobierajski (Contributor), Nikita Medvedev (Contributor), Vladimir Lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Viacheslav Medvedev (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)

Research output: Contribution to conferencePoster

Conference

Conference4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018
Abbreviated titlePhotonDiag 2018
CountryGermany
CityHamburg
Period17/09/1819/09/18
Internet address

Cite this

Makhotkin, I. A., Milov, I., Sobierajski, R., Medvedev, N., Lipp, V., Ziaja, B., ... Bijkerk, F. (2018). Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, Hamburg, Germany.