Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses

Igor A. Makhotkin; Igor  Milov; Ryszard Sobierajski; Nikita Medvedev; Vladimir Lipp; B. Ziaja; V. Khokhlov; V. Zhakhovsky; Yu. Petrov; V. Shepelev; D. Ilnitsky; K. Migdal; N. Inogamov; Viacheslav Medvedev; Eric  Louis; F. Bijkerk

Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses

Igor A. Makhotkin, Igor Milov (Contributor), Ryszard Sobierajski (Contributor), Nikita Medvedev (Contributor), Vladimir Lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Viacheslav Medvedev (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)

XUV Optics

Research output: Contribution to conference › Poster › Academic

Original language	English
Publication status	Published - 17 Sep 2018
Event	4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018 - Hamburg, Germany Duration: 17 Sep 2018 → 19 Sep 2018 Conference number: 4 https://lightsources.org/event/photondiag-2018-workshop-on-fel-photon-diagnostics-instrumentation-and-beamlines-design/

Conference

Conference	4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018
Abbreviated title	PhotonDiag 2018
Country	Germany
City	Hamburg
Period	17/09/18 → 19/09/18
Internet address	https://lightsources.org/event/photondiag-2018-workshop-on-fel-photon-diagnostics-instrumentation-and-beamlines-design/

Cite this

Makhotkin, I. A., Milov, I., Sobierajski, R., Medvedev, N., Lipp, V., Ziaja, B., Khokhlov, V., Zhakhovsky, V., Petrov, Y., Shepelev, V., Ilnitsky, D., Migdal, K., Inogamov, N., Medvedev, V., Louis, E., & Bijkerk, F. (2018). Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, Hamburg, Germany.

Makhotkin, Igor A. ; Milov, Igor ; Sobierajski, Ryszard ; Medvedev, Nikita ; Lipp, Vladimir ; Ziaja, B. ; Khokhlov, V. ; Zhakhovsky, V. ; Petrov, Yu. ; Shepelev, V. ; Ilnitsky, D. ; Migdal, K. ; Inogamov, N. ; Medvedev, Viacheslav ; Louis, Eric ; Bijkerk, F. / Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, Hamburg, Germany.

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title = "Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses",

author = "Makhotkin, {Igor A.} and Igor Milov and Ryszard Sobierajski and Nikita Medvedev and Vladimir Lipp and B. Ziaja and V. Khokhlov and V. Zhakhovsky and Yu. Petrov and V. Shepelev and D. Ilnitsky and K. Migdal and N. Inogamov and Viacheslav Medvedev and Eric Louis and F. Bijkerk",

year = "2018",

month = sep,

day = "17",

language = "English",

note = "4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, PhotonDiag 2018 ; Conference date: 17-09-2018 Through 19-09-2018",

url = "https://lightsources.org/event/photondiag-2018-workshop-on-fel-photon-diagnostics-instrumentation-and-beamlines-design/",

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Makhotkin, IA , Milov, I, Sobierajski, R, Medvedev, N, Lipp, V, Ziaja, B, Khokhlov, V, Zhakhovsky, V, Petrov, Y, Shepelev, V, Ilnitsky, D, Migdal, K, Inogamov, N, Medvedev, V, Louis, E & Bijkerk, F 2018, 'Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses', 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, Hamburg, Germany, 17/09/18 - 19/09/18.

Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses. / Makhotkin, Igor A.; Milov, Igor (Contributor); Sobierajski, Ryszard (Contributor); Medvedev, Nikita (Contributor); Lipp, Vladimir (Contributor); Ziaja, B. (Contributor); Khokhlov, V. (Contributor); Zhakhovsky, V. (Contributor); Petrov, Yu. (Contributor); Shepelev, V. (Contributor); Ilnitsky, D. (Contributor); Migdal, K. (Contributor); Inogamov, N. (Contributor); Medvedev, Viacheslav (Contributor); Louis, Eric (Contributor); Bijkerk, F. (Contributor).

2018. Poster session presented at 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018, Hamburg, Germany.

Research output: Contribution to conference › Poster › Academic

TY - CONF

T1 - Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses

AU - Makhotkin, Igor A.

A2 - Milov, Igor

A2 - Sobierajski, Ryszard

A2 - Medvedev, Nikita

A2 - Lipp, Vladimir

A2 - Ziaja, B.

A2 - Khokhlov, V.

A2 - Zhakhovsky, V.

A2 - Petrov, Yu.

A2 - Shepelev, V.

A2 - Ilnitsky, D.

A2 - Migdal, K.

A2 - Inogamov, N.

A2 - Medvedev, Viacheslav

A2 - Louis, Eric

A2 - Bijkerk, F.

N1 - Conference code: 4

PY - 2018/9/17

Y1 - 2018/9/17

M3 - Poster

T2 - 4th FELs OF EUROPE workshop on FEL Photon Diagnostics, Instrumentation, and Beamline Design, PhotonDiag 2018

Y2 - 17 September 2018 through 19 September 2018

ER -