Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]

G.C. Cardarilli; M. Ottavi; S. Pontarelli; M. Re; A. Salsano

doi:10.1109/DFTVS.2004.1347836

Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]

G.C. Cardarilli, M. Ottavi, S. Pontarelli, M. Re, A. Salsano

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

15 Citations (Scopus)

Abstract

This paper introduces a very flexible approach for the evaluation of bit error rates (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into account the impact of both erasures and random errors, allowing a smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques. The flexibility of the proposed method is finally shown by applying it to different cases of interest.

Original language	English
Title of host publication	19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings
Place of Publication	Piscataway, NJ
Publisher	IEEE
ISBN (Print)	0-7695-2241-6
DOIs	https://doi.org/10.1109/DFTVS.2004.1347836
Publication status	Published - 2004
Externally published	Yes
Event	19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004 - Cannes, France Duration: 10 Oct 2004 → 13 Oct 2004 Conference number: 19

Publication series

Name	IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004
Publisher	IEEE
Number	19
Volume	2004
ISSN (Print)	1550-5774

Conference

Conference	19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004
Abbreviated title	DFT 2004
Country/Territory	France
City	Cannes
Period	10/10/04 → 13/10/04

Keywords

Error detection/correction codes
EDAC
Solid state mass memories
SSMM data integrity
Reed Solomon codes
Storage systems
Bit error rates (BER)
Markov models
Uncorrectable codeword probability
Random errors
Erasure errors
Scrubbing techniques

Access to Document

10.1109/DFTVS.2004.1347836

Cite this

Cardarilli, G. C., Ottavi, M., Pontarelli, S., Re, M., & Salsano, A. (2004). Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]. In 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings Article 1347836 (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004; Vol. 2004, No. 19). IEEE. https://doi.org/10.1109/DFTVS.2004.1347836

Cardarilli, G.C. ; Ottavi, M. ; Pontarelli, S. et al. / Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]. 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. Piscataway, NJ : IEEE, 2004. (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004; 19).

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abstract = "This paper introduces a very flexible approach for the evaluation of bit error rates (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into account the impact of both erasures and random errors, allowing a smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques. The flexibility of the proposed method is finally shown by applying it to different cases of interest.",

keywords = "Error detection/correction codes, EDAC, Solid state mass memories, SSMM data integrity, Reed Solomon codes, Storage systems, Bit error rates (BER), Markov models, Uncorrectable codeword probability, Random errors, Erasure errors, Scrubbing techniques",

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Cardarilli, GC, Ottavi, M, Pontarelli, S, Re, M & Salsano, A 2004, Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]. in 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings., 1347836, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004, no. 19, vol. 2004, IEEE, Piscataway, NJ, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004, Cannes, France, 10/10/04. https://doi.org/10.1109/DFTVS.2004.1347836

Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]. / Cardarilli, G.C.; Ottavi, M.; Pontarelli, S. et al.
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. Piscataway, NJ: IEEE, 2004. 1347836 (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004; Vol. 2004, No. 19).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Cardarilli, G.C.

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N2 - This paper introduces a very flexible approach for the evaluation of bit error rates (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into account the impact of both erasures and random errors, allowing a smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques. The flexibility of the proposed method is finally shown by applying it to different cases of interest.

AB - This paper introduces a very flexible approach for the evaluation of bit error rates (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into account the impact of both erasures and random errors, allowing a smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques. The flexibility of the proposed method is finally shown by applying it to different cases of interest.

KW - Error detection/correction codes

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KW - SSMM data integrity

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KW - Bit error rates (BER)

KW - Markov models

KW - Uncorrectable codeword probability

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Cardarilli GC, Ottavi M, Pontarelli S, Re M, Salsano A. Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]. In 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. Piscataway, NJ: IEEE. 2004. 1347836. (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2004; 19). doi: 10.1109/DFTVS.2004.1347836

Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]

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