Defect Based Test Selection for Large Mixed-Signal Circuits

R.G.J. Arendsen

    Research output: ThesisPhD Thesis - Research UT, graduation external

    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Herrmann, O.E., Supervisor
    • Brombacher, A.C., Supervisor
    Award date11 Apr 1997
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-90-10409-7
    Publication statusPublished - 11 Apr 1997

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