Original language | English |
---|---|
Qualification | Doctor of Philosophy |
Awarding Institution |
|
Supervisors/Advisors |
|
Award date | 11 Apr 1997 |
Place of Publication | Enschede |
Publisher | |
Print ISBNs | 90-90-10409-7 |
Publication status | Published - 11 Apr 1997 |
Defect Based Test Selection for Large Mixed-Signal Circuits
R.G.J. Arendsen
Research output: Thesis › PhD Thesis - Research UT, graduation external