Defect Based Test Selection for Large Mixed-Signal Circuits

R.G.J. Arendsen

    Research output: ThesisPhD Thesis - Research UT, graduation external

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Herrmann, O.E., Supervisor
    • Brombacher, A.C., Supervisor
    Award date11 Apr 1997
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9010409-7
    Publication statusPublished - 11 Apr 1997

    Keywords

    • METIS-111388

    Cite this

    Arendsen, R. G. J. (1997). Defect Based Test Selection for Large Mixed-Signal Circuits. Enschede: Universiteit Twente, Laboratorium voor Netwerktheorie.