Defect-Based Testing of Digital Superconductor Circuits

A.J. Arun, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of IEEE International WOrkshop on Defect-Based Testing DBT
    Place of PublicationNappa, USA
    Pages74-79
    Number of pages6
    Publication statusPublished - 1 Apr 2003

    Keywords

    • METIS-214898

    Cite this

    Arun, A. J., & Kerkhoff, H. G. (2003). Defect-Based Testing of Digital Superconductor Circuits. In Proceedings of IEEE International WOrkshop on Defect-Based Testing DBT (pp. 74-79). Nappa, USA.