Defect-Based Testing of Digital Superconductor Circuits

A.J. Arun, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of IEEE International WOrkshop on Defect-Based Testing DBT
Place of Publication	Nappa, USA
Pages	74-79
Number of pages	6
Publication status	Published - 1 Apr 2003

Keywords

@inproceedings{572a79151ca04553a23fb06675314acc,

title = "Defect-Based Testing of Digital Superconductor Circuits",

keywords = "METIS-214898",

author = "A.J. Arun and Kerkhoff, {Hans G.}",

year = "2003",

month = apr,

day = "1",

language = "Undefined",

pages = "74--79",

booktitle = "Proceedings of IEEE International WOrkshop on Defect-Based Testing DBT",

}