Defect BasedTesting of Superconductor Electronics

A.J. Arun, S. Heuvelmans, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{13bccbb0ea244422bc6b2a48e6feb717,

title = "Defect BasedTesting of Superconductor Electronics",

keywords = "METIS-207858",

author = "A.J. Arun and S. Heuvelmans and Kerkhoff, {Hans G.}",

year = "2002",

month = nov,

day = "29",

language = "Undefined",

isbn = "90-73461-33-2",

pages = "428--435",

booktitle = "Proceedings ProRISC 2002",

}