Defect Grating Simulations: Perturbations with AFM-like Tips

Remco Stoffer, Manfred Hammer

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    18 Downloads (Pure)

    Abstract

    A defect grating in a silicon on insulator waveguide is simulated. We consider spectral changes in the optical transmission when a thin silicon nitride or silicon tip is scanned across the defect. The tip perturbs the resonance field, moving its peak wavelength andpossibly changing its shape and quality factor. For the nitride tip, the influence is mostly a spectral shift; for silicon, the change of the resonance shape is pronounced. In particular for the nitride tip we observe a close correspondence between the wavelength shift as a function of tip position, and the local intensity in the unperturbed structure.
    Original languageUndefined
    Title of host publication11th Annual Symposium IEEE/LEOS Benelux
    EditorsA.M.J. Koonen, X.M.J. Leijtens, H.P.A. van den Boom, E.J.M. Verdurmen, J. Molina Vasquez
    Place of PublicationEindhoven
    PublisherIEEE/LEOS Benelux Chapter
    Pages105-108
    Number of pages4
    ISBN (Print)978-90-6144-989-8
    Publication statusPublished - 9 Nov 2006
    Event11th Annual Symposium IEEE/LEOS Benelux Chapter 2006 - Eindhoven, The Netherlands, Eindhoven, Netherlands
    Duration: 30 Nov 20061 Dec 2006
    Conference number: 11

    Publication series

    Name
    Numbersupplement

    Conference

    Conference11th Annual Symposium IEEE/LEOS Benelux Chapter 2006
    CountryNetherlands
    CityEindhoven
    Period30/11/061/12/06

    Keywords

    • IR-57752
    • METIS-237618
    • EWI-8166

    Cite this