Defect Grating Simulations: Perturbations with AFM-like Tips

Remco Stoffer; Manfred Hammer

Defect Grating Simulations: Perturbations with AFM-like Tips

Remco Stoffer
, Manfred Hammer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

72 Downloads (Pure)

Abstract

A defect grating in a silicon on insulator waveguide is simulated. We consider spectral changes in the optical transmission when a thin silicon nitride or silicon tip is scanned across the defect. The tip perturbs the resonance field, moving its peak wavelength andpossibly changing its shape and quality factor. For the nitride tip, the influence is mostly a spectral shift; for silicon, the change of the resonance shape is pronounced. In particular for the nitride tip we observe a close correspondence between the wavelength shift as a function of tip position, and the local intensity in the unperturbed structure.

Original language	Undefined
Title of host publication	11th Annual Symposium IEEE/LEOS Benelux
Editors	A.M.J. Koonen, X.M.J. Leijtens, H.P.A. van den Boom, E.J.M. Verdurmen, J. Molina Vasquez
Place of Publication	Eindhoven
Publisher	IEEE
Pages	105-108
Number of pages	4
ISBN (Print)	978-90-6144-989-8
Publication status	Published - 9 Nov 2006
Event	11th Annual Symposium IEEE/LEOS Benelux Chapter 2006 - Eindhoven, The Netherlands, Eindhoven, Netherlands Duration: 30 Nov 2006 → 1 Dec 2006 Conference number: 11

Publication series

Name
Number	supplement

Conference

Conference	11th Annual Symposium IEEE/LEOS Benelux Chapter 2006
Country/Territory	Netherlands
City	Eindhoven
Period	30/11/06 → 1/12/06

Keywords

IR-57752
METIS-237618
EWI-8166

Access to Document

Stoffer06defect

http://eprints.eemcs.utwente.nl/secure2/8166/01/sth06.pdf

Cite this

@inproceedings{502463253615446fad938c4d2685ffbf,

title = "Defect Grating Simulations: Perturbations with AFM-like Tips",

abstract = "A defect grating in a silicon on insulator waveguide is simulated. We consider spectral changes in the optical transmission when a thin silicon nitride or silicon tip is scanned across the defect. The tip perturbs the resonance field, moving its peak wavelength andpossibly changing its shape and quality factor. For the nitride tip, the influence is mostly a spectral shift; for silicon, the change of the resonance shape is pronounced. In particular for the nitride tip we observe a close correspondence between the wavelength shift as a function of tip position, and the local intensity in the unperturbed structure.",

keywords = "IR-57752, METIS-237618, EWI-8166",

author = "Remco Stoffer and Manfred Hammer",

year = "2006",

month = nov,

day = "9",

language = "Undefined",

isbn = "978-90-6144-989-8",

publisher = "IEEE",

number = "supplement",

pages = "105--108",

editor = "A.M.J. Koonen and X.M.J. Leijtens and \{van den Boom\}, H.P.A. and E.J.M. Verdurmen and \{Molina Vasquez\}, J.",

booktitle = "11th Annual Symposium IEEE/LEOS Benelux",

address = "United States",

note = "11th Annual Symposium IEEE/LEOS Benelux Chapter 2006 ; Conference date: 30-11-2006 Through 01-12-2006",

}

Stoffer, R & Hammer, M 2006, Defect Grating Simulations: Perturbations with AFM-like Tips. in AMJ Koonen, XMJ Leijtens, HPA van den Boom, EJM Verdurmen & J Molina Vasquez (eds), 11th Annual Symposium IEEE/LEOS Benelux. IEEE, Eindhoven, pp. 105-108, 11th Annual Symposium IEEE/LEOS Benelux Chapter 2006, Eindhoven, Netherlands, 30/11/06. <http://eprints.eemcs.utwente.nl/secure2/8166/01/sth06.pdf>

Defect Grating Simulations: Perturbations with AFM-like Tips. / Stoffer, Remco; Hammer, Manfred.
11th Annual Symposium IEEE/LEOS Benelux. ed. / A.M.J. Koonen; X.M.J. Leijtens; H.P.A. van den Boom; E.J.M. Verdurmen; J. Molina Vasquez. Eindhoven: IEEE, 2006. p. 105-108.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Defect Grating Simulations: Perturbations with AFM-like Tips

AU - Stoffer, Remco

AU - Hammer, Manfred

N1 - Conference code: 11

PY - 2006/11/9

Y1 - 2006/11/9

N2 - A defect grating in a silicon on insulator waveguide is simulated. We consider spectral changes in the optical transmission when a thin silicon nitride or silicon tip is scanned across the defect. The tip perturbs the resonance field, moving its peak wavelength andpossibly changing its shape and quality factor. For the nitride tip, the influence is mostly a spectral shift; for silicon, the change of the resonance shape is pronounced. In particular for the nitride tip we observe a close correspondence between the wavelength shift as a function of tip position, and the local intensity in the unperturbed structure.

AB - A defect grating in a silicon on insulator waveguide is simulated. We consider spectral changes in the optical transmission when a thin silicon nitride or silicon tip is scanned across the defect. The tip perturbs the resonance field, moving its peak wavelength andpossibly changing its shape and quality factor. For the nitride tip, the influence is mostly a spectral shift; for silicon, the change of the resonance shape is pronounced. In particular for the nitride tip we observe a close correspondence between the wavelength shift as a function of tip position, and the local intensity in the unperturbed structure.

KW - IR-57752

KW - METIS-237618

KW - EWI-8166

M3 - Conference contribution

SN - 978-90-6144-989-8

SP - 105

EP - 108

BT - 11th Annual Symposium IEEE/LEOS Benelux

A2 - Koonen, A.M.J.

A2 - Leijtens, X.M.J.

A2 - van den Boom, H.P.A.

A2 - Verdurmen, E.J.M.

A2 - Molina Vasquez, J.

PB - IEEE

CY - Eindhoven

T2 - 11th Annual Symposium IEEE/LEOS Benelux Chapter 2006

Y2 - 30 November 2006 through 1 December 2006

ER -