Defect-oriented Testing: An Industrial Experiment

N. Engin, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Original languageUndefined
    Title of host publicationIEEE International Mixed-Signal Testing Workshop
    Place of PublicationWhistler, Canada
    Pages141-146
    Number of pages6
    Publication statusPublished - 1 Jun 1999

    Keywords

    • METIS-113036

    Cite this