Defect-Oriented Testing of an RSFQ D-type Flip-Flop

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC, November, 2004
    Place of PublicationVeldhoven, The Netherlands
    PublisherSTW
    Pages-
    Publication statusPublished - 25 Nov 2004
    Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004
    Conference number: 15

    Conference

    Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
    Abbreviated titleProRisc
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • METIS-218940

    Cite this

    Arun, A. J., Weusthof, M. H. H., & Kerkhoff, H. G. (2004). Defect-Oriented Testing of an RSFQ D-type Flip-Flop. In Proceedings of the ProRISC, November, 2004 (pp. -). Veldhoven, The Netherlands: STW.