Defect-Oriented Testing of an RSFQ D-type Flip-Flop

A.J. Arun, Marcel H.H. Weusthof, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC, November, 2004
Place of Publication	Veldhoven, The Netherlands
Publisher	STW
Pages	-
Publication status	Published - 25 Nov 2004
Event	15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands Duration: 25 Nov 2004 → 26 Nov 2004 Conference number: 15

Conference	15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
Abbreviated title	ProRisc
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/04 → 26/11/04

Keywords

@inproceedings{fe1b7734ba33492fbe01f86d3176cf7b,

title = "Defect-Oriented Testing of an RSFQ D-type Flip-Flop",

keywords = "METIS-218940",

author = "A.J. Arun and Weusthof, \{Marcel H.H.\} and Kerkhoff, \{Hans G.\}",

year = "2004",

month = nov,

day = "25",

language = "Undefined",

pages = "--",

booktitle = "Proceedings of the ProRISC, November, 2004",

publisher = "STW",

note = "15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 ; Conference date: 25-11-2004 Through 26-11-2004",

}

TY - GEN

T1 - Defect-Oriented Testing of an RSFQ D-type Flip-Flop

AU - Arun, A.J.

AU - Weusthof, Marcel H.H.

AU - Kerkhoff, Hans G.

N1 - Conference code: 15

PY - 2004/11/25

Y1 - 2004/11/25

KW - METIS-218940

M3 - Conference contribution

SP - -

BT - Proceedings of the ProRISC, November, 2004

PB - STW

CY - Veldhoven, The Netherlands

T2 - 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004

Y2 - 25 November 2004 through 26 November 2004

ER -