Defect-Oriented testing of Josephson Logic Circuits and Systems

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 6th Twente Workshop on Superconducting Electronics
    Place of PublicationEnschede, The Netherlands
    Pages13-14
    Publication statusPublished - 27 Jan 2000

    Keywords

    • METIS-113028

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