Defect-Oriented testing of Josephson Logic Circuits and Systems

Hans G. Kerkhoff, H. Speek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 6th Twente Workshop on Superconducting Electronics
Place of Publication	Enschede, The Netherlands
Pages	13-14
Publication status	Published - 27 Jan 2000

Keywords

@inproceedings{4036b1621e6a416db7e4cb025800ac57,

title = "Defect-Oriented testing of Josephson Logic Circuits and Systems",

keywords = "METIS-113028",

author = "Kerkhoff, {Hans G.} and H. Speek",

year = "2000",

month = jan,

day = "27",

language = "Undefined",

pages = "13--14",

booktitle = "Proceedings of the 6th Twente Workshop on Superconducting Electronics",

}