Defect-oriented Testing of Josephson Logic Circuits and Systems

Hans G. Kerkhoff, H. Speek

    Research output: Contribution to journal › Article › Academic › peer-review

    12 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)261-268
    Number of pages8
    JournalPhysica C
    Publication statusPublished - 2001

    Keywords

    • METIS-201753

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