Defect-oriented testing of microelectronics / fluidic systems

Hans G. Kerkhoff, R.E. Oosterbroek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 4th International symposium on microTAS 2000
Place of Publication	Enschede, The Netherlands
Pages	315-318
Publication status	Published - 14 May 2000

Keywords

@inproceedings{92f1d1a31a0a4666b4bb860d285bb7d5,

title = "Defect-oriented testing of microelectronics / fluidic systems",

keywords = "METIS-113012",

author = "Kerkhoff, {Hans G.} and R.E. Oosterbroek",

year = "2000",

month = may,

day = "14",

language = "Undefined",

isbn = "0-7923-6387-6",

pages = "315--318",

booktitle = "Proceedings of the 4th International symposium on microTAS 2000",

}