Defect Scaling with Contact Area in EGaIn-Based Junctions: Impact on Quality, Joule Heating, and Apparent Injection Current

Li Jiang, C. S. Suchand Sangeeth, Albert Wan, Ayelet Vilan, Christian A. Nijhuis*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

50 Citations (Scopus)

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Physics & Astronomy

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Chemistry