Defects on Si(001)

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 15 Nov 2001
EventDutch Scanning Probe Microscopy Day 2001 - University of Twente, Enschede, Netherlands
Duration: 15 Nov 200115 Nov 2001

Workshop

WorkshopDutch Scanning Probe Microscopy Day 2001
Country/TerritoryNetherlands
CityEnschede
Period15/11/0115/11/01

Keywords

  • METIS-204950

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