Degradation and reliability of silicon power transistors

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publication2013 IEEE International Integrated Reliability Workshop Final Report
    DOIs
    Publication statusPublished - Oct 2013
    EventIEEE International Integrated Reliability Workshop, IIRW 2013 - Stanford Sierra Conference Center, Fallen Leaf Lake, United States
    Duration: 13 Oct 201317 Oct 2013

    Workshop

    WorkshopIEEE International Integrated Reliability Workshop, IIRW 2013
    Abbreviated titleIIRW 2013
    CountryUnited States
    CityFallen Leaf Lake
    Period13/10/1317/10/13

    Cite this

    Schmitz, J. (2013). Degradation and reliability of silicon power transistors. In 2013 IEEE International Integrated Reliability Workshop Final Report https://doi.org/10.1109/iirw.2013.6804144