Degradation and reliability of silicon power transistors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	2013 IEEE International Integrated Reliability Workshop Final Report
DOIs	https://doi.org/10.1109/iirw.2013.6804144
Publication status	Published - Oct 2013
Event	IEEE International Integrated Reliability Workshop, IIRW 2013 - Stanford Sierra Conference Center, Fallen Leaf Lake, United States Duration: 13 Oct 2013 → 17 Oct 2013

Workshop	IEEE International Integrated Reliability Workshop, IIRW 2013
Abbreviated title	IIRW 2013
Country/Territory	United States
City	Fallen Leaf Lake
Period	13/10/13 → 17/10/13

Access to Document

@inproceedings{addb14458be04195a13fed9e2df62b16,

title = "Degradation and reliability of silicon power transistors",

author = "Jurriaan Schmitz",

year = "2013",

month = oct,

doi = "10.1109/iirw.2013.6804144",

language = "English",

booktitle = "2013 IEEE International Integrated Reliability Workshop Final Report",

note = "IEEE International Integrated Reliability Workshop, IIRW 2013, IIRW 2013 ; Conference date: 13-10-2013 Through 17-10-2013",

}

TY - GEN

T1 - Degradation and reliability of silicon power transistors

AU - Schmitz, Jurriaan

PY - 2013/10

Y1 - 2013/10

U2 - 10.1109/iirw.2013.6804144

DO - 10.1109/iirw.2013.6804144

M3 - Conference contribution

BT - 2013 IEEE International Integrated Reliability Workshop Final Report

T2 - IEEE International Integrated Reliability Workshop, IIRW 2013

Y2 - 13 October 2013 through 17 October 2013

ER -