Degradation in Multi Layer Interconnects by Fast Thermal Cycling Stress

Van Hieu Nguyen, Cora Salm, J. Vroemen, J. Voets, B.H. Krabbenborg, J. Bisschop, A.J. Mouthaan, F.G. Kuper

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 18 Dec 2001
Event	Wetenschappelijke Vergadering Werkgemeenschap Gecondenseerde Materie 2001 - Veldhoven, Netherlands Duration: 18 Dec 2001 → 19 Dec 2001

Conference	Wetenschappelijke Vergadering Werkgemeenschap Gecondenseerde Materie 2001
Country/Territory	Netherlands
City	Veldhoven
Period	18/12/01 → 19/12/01

Keywords

@conference{96876b1eef064aa282121f9faedfd017,

title = "Degradation in Multi Layer Interconnects by Fast Thermal Cycling Stress",

keywords = "METIS-201151",

author = "Nguyen, {Van Hieu} and Cora Salm and J. Vroemen and J. Voets and B.H. Krabbenborg and J. Bisschop and A.J. Mouthaan and F.G. Kuper",

year = "2001",

month = dec,

day = "18",

language = "Undefined",

pages = "--",

note = "null ; Conference date: 18-12-2001 Through 19-12-2001",

}