Delay-fault ATPG for high-speed electrically erasable PLDs

Hans G. Kerkhoff, M. Sachdev, C. Klaasen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop
    Place of PublicationSete, France
    Pages228-232
    Publication statusPublished - 12 Jun 1996

    Keywords

    • METIS-112944

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