Delay Fault Testing of Embedded Cores

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of PROGRESS Embedded Systems Symposium
    Pages250-256
    Number of pages7
    Publication statusPublished - 1 Oct 2003

    Keywords

    • METIS-214907

    Cite this

    Vermaak, H. J., & Kerkhoff, H. G. (2003). Delay Fault Testing of Embedded Cores. In Proceedings of PROGRESS Embedded Systems Symposium (pp. 250-256)