Delay Fault Testing of Embedded Cores

H.J. Vermaak, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of PROGRESS Embedded Systems Symposium
Pages	250-256
Number of pages	7
Publication status	Published - 1 Oct 2003

Keywords

@inproceedings{59e3441ea5f141b6a13a54ced1601e8f,

title = "Delay Fault Testing of Embedded Cores",

keywords = "METIS-214907",

author = "H.J. Vermaak and Kerkhoff, {Hans G.}",

year = "2003",

month = oct,

day = "1",

language = "Undefined",

isbn = "90-73461-37-5",

pages = "250--256",

booktitle = "Proceedings of PROGRESS Embedded Systems Symposium",

}